Advanced Calculations for Defects in Materials: Electronic Structure Methods
Audrius Alkauskas, Peter Deák, Jörg Neugebauer, Alfredo Pasquarello, Chris G. Van de Walle, Editors…
Audrius Alkauskas, Peter Deák, Jörg Neugebauer, Alfredo Pasquarello, Chris G. Van de Walle, Editors…